Characterization of planar flaws by synthetic focusing of sound beam using linear arrays

(in lingua inglese)

Accurate characterization of planar flaws, in terms of orientation and depth, was carried out using an approach combining a linear array and SAFT. The major advantages of this approach are: (i) a single channel instrument with multiplexer is sufficient for data acquisition, (ii) divergent sound beam because of small element size, and small pitch of an array, results in effective SAFT processing and (iii) no computation of focal laws is required, which is a must for conventional phased array.